AI4Wave Wavefront Sensing Model for PSM

Explore the future of optical metrology with AI4Wave, our patented wavefront sensing technology. Easily integrating with your existing Point Source Microscope (PSM from Optical Perspective Group) , AI4Wave adds advanced features that simplify your metrology process while maintaining the highest level of precision. It transforms your PSM into a powerful instrument, delivering accurate wavefront measurements across various optical surfaces, including asphere.

For a quote, contact us at: customerservice@innovationsforesight.com

Why AI4Wave?

• Unmatched Simplicity: Our AI4Wave technology takes the complexity out of wavefront measurements, making it effortless for you.
• Versatile Applications: Perfect for research, astronomy, medical imaging, optical manufacturing, and any field where optical precision matters.
• Elevate Your PSM Today: Unlock the full potential of your PSM with AI4Wave software upgrade.
• Set new standards in your industry with AI4Wave the ultimate game-changer in optical metrology.
• Contact us :customerservice@innovationsforesight.com

Key Benefits: 

• Low-cost, AI-driven wavefront sensing,
• Seamless customization and integration with your software and system,
• High Dynamic Range,
• Full surface data,
• Precision and sensitivity < 0.01 wave rms on Zernike coefficient,
• Allows you to output all optical measurements including wavefront aberration, MTF, PSF and more.
• Robust against Vibration,
• Requires no additional hardware, just a single defocused image from your system,
• Mount anywhere you mount the PSM,
• Upgradeable to any optical workstation,
• Found out more ways in which AI4Wave/PSM make your life easier - visit www.OpticalPerspectives.com.

PSM Specifications: 

For detailed specifications, please visit the Optical Perspectives Group website at: https://www.opticalperspectives.com/product/point-source-microscope/